NewswireTODAY - /newswire/ - Windsor, CT, United States, 2010/02/12 - Fischer Technology, Inc. - The newest generation of the proven FISCHERSCOPE® XDAL and XDLM x-ray spectrometers is now available. The development process focused on the unit’s performance, ergonomics and design - Helmut-Fischer.com.

The XDLM spectrometers with micro focus tube and proportional counter tube are ideally suited for the inspection of parts where small structures are measured. Typical applications are measurements on pc-boards, plug contacts and electronic components. XDLM spectrometers are equipped with four exchangeable apertures and a programmable XY(Z) measuring stage. This makes them ideally suited for testing mass-produced parts.

The FISCHERSCOPE® X-RAY XDAL is an X-Ray spectrometer for quantitative materials analysis. The XDAL spectrometers with silicon PIN detectors provide reliable analysis results and coating thickness readings even with a small concentration and very thin coatings. With their fast and highly precise XY(Z) measuring stage, they are ideally suited for automated sample measurements. Due to the broad range of detectable elements from Aluminum to Uranium, the array of applications for the FISCHERSCOPE® X-RAY XDAL stretches from industry to science. Whether the analysis applications are of metallurgic, geologic, petrochemical or other nature, the FISCHERSCOPE® X-RAY XDAL is a powerful and cost effective spectrometer for the task.

The integrated color video camera enables the X-Ray beam to be positioned quickly and precisely on the area of the specimen to be analyzed. The instrument delivers a combination of performance and features not found in other analysis equipment in this price category.

The large measurement chamber, the programmable X-Y stage and top down primary beam design with movable Z-axis X-Ray source and detector assembly make this system highly suited for programmed measurements of several samples or scanning of larger specimens.

The unique Software WinFTM® Version 6 is the core of this instrument. It enables the analysis of materials with up to 24 elements, without calibration standards and with predicted measurement accuracy, as well as the measurement of very complex coating systems.

The XDAL and XDLM spectrometers have an excellent long-term stability, which is reflected in a significantly reduced calibration effort, among other things. Using the FISCHER fundamental parameter method, coating systems as well as solid and liquid samples can be analyzed standard-free.

Fischer Technology (fischer-technology.com) is U.S. manufacturer of coating thickness measurement, material analysis, micro-hardness measurement and materials testing.

Agency / Source: Fischer Technology, Inc.

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