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Teseq’s NSG 4070 Test System Effectively Generates a Variety of Automotive RF Immunity Test Methods - Teseq Inc., a developer of instrumentation and systems for EMC emission and immunity testing, has upgraded its multi-functional NSG 4070 EMC immunity test system to meet automotive industry standards for bulk current injection (BCI) test methods
Teseq’s NSG 4070 Test System Effectively Generates a Variety of Automotive RF Immunity Test Methods

 

NewswireToday - /newswire/ - Edison, NJ, United States, 2008/07/22 - Teseq Inc., a developer of instrumentation and systems for EMC emission and immunity testing, has upgraded its multi-functional NSG 4070 EMC immunity test system to meet automotive industry standards for bulk current injection (BCI) test methods.

   
 
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Teseq Inc., a leading developer and provider of instrumentation and systems for EMC emission and immunity testing, has upgraded its multifunctional NSG 4070 EMC immunity test system to meet automotive industry standards for bulk current injection (BCI) test methods, including ISO 11452-4.

The system features substitution and closed loop test methods, making the system ideal for determining the immunity of electronic components used in many domestic and foreign passenger cars and commercial vehicles among leading automotive manufacturers including Ford, GM, Chrysler, Nissan, Renault and Peugeot. The NSG 4070 also includes an optional monitoring probe for recording the actual injected current or for when closed loop testing is required.

With a wide frequency range of 9 KHz to 1 GHz and a modular set-up that uses internal or external amplifiers, the NSG 4070 is also useful in non-automotive test labs and design departments for RF conducted immunity testing according to IEC 61000-4-6. Testing to other industry standards for radiated immunity, such as IEC 61000-4-3 and IEC 61000-4-20, is also possible with optional software.

The front panel of the NSG 4070 features a 5.7-inch TFT color display, push buttons for access to important functions, a 9 KHz to 1 GHz three-channel power meter and external access to signal generator output as well as power amplifier input and output. A convenient USB port enables the transfer of test and measurement data for documentation purposes.

A built-in report generator allows access to test results and easy-to-use firmware makes the system independent from external PC and control software. In addition, the NSG 4070 includes basic remote control software that enables remote testing via an RS232, LAN or USB port.

The system’s back panel offers analog, digital and optical monitoring inputs for extensive equipment under test (EUT) monitoring options. A user port for four TTL inputs, four TTL outputs and supply voltages as well as EUT monitoring ports for analog, digital and optical inputs makes the NSG 4070 ideal for individual monitoring and control applications. The system includes a 10 MHz reference for synchronization and a trigger input for external control of measurement routines.

Pricing for the NSG 4070 Test System starts at $13,900. Lead-time is approximately 8 weeks ARO.

For more information, please contact MaryJane Salvador, Teseq Inc., 52 Mayfield Avenue, Edison, N.J. 08837. T: (732) 417-0501 x239; F: (732) 417-0511; E: maryjane.salvador[.]teseq.com.

READER SERVICE INQUIRIES: Please forward all reader service inquiries to MaryJane Salvador, Teseq Inc., 52 Mayfield Avenue, Edison, N.J. 08837.

Teseq Inc. was formerly known as Schaffner Test Systems until a management buyout was finalized in November 2006. The company provides EMC instrumentation and systems for EMC emission and immunity testing in the automotive, consumer electronics, telecommunications, medical, aerospace and defense industries. It has approximately 130 employees and has been accredited to perform calibration services according to ISO 17025 at its Edison, N.J. laboratory. Teseq is the only pulsed immunity manufacturer in North America with an accredited calibration lab.

 
 
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Teseq’s NSG 4070 Test System Effectively Generates a Variety of Automotive RF Immunity Test Methods

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Publisher Contact: Christina Sanchez 
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