NewswireToday - /newswire/ -
Sellersville, PA, United States, 2008/06/10 - Teseq, Inc. has released the new NSG 3060 test generator featuring an innovative design that uses modular architecture to provide system configuration meeting the needs of basic and sophisticated test laboratories.
Teseq Inc., a leading developer and provider of instrumentation and test systems for EMC emission and immunity, has released the new NSG 3060 test generator featuring an innovative design that uses modular architecture to provide system configurations meeting the needs of basic and sophisticated test laboratories. The generator’s user-friendly interface is complete with a 7” high-contrast, color touch-screen and superb graphics, which enable quick set-up of test procedures.
The multi-functional NSG 3060 provides a surge voltage of up to 6.6 kV for testing of combination wave, ring wave, EFT pulses as well as burst, dip/interrupt and magnetic field applications. The generator’s powerful processors satisfy the unique coupling requirements specified by ANSI C62.41, making the system compatible with both ANSI and IEC coupling methods. The NSG 3060 also meets the requirements for CE Marking.
The system’s unique “master-slave” concept enables new pulse generator modules to be quickly added to the original system configuration. In addition, this feature allows for individual pulse modules to be calibrated separately with the calibration data and correction factors to be stored on the slave controller. Modules can also be simply installed without the user having to return the system for calibration.
The generator’s touch panel display enables the creation of multi-step test procedures, programming of ramp functions and easy changes to sequence or parameter values. To effectively activate critical threshold values during a test, the selection of “Expert Mode” allows the user to make a manual parameter change by simply using the thumbwheel.
In addition, standardized tests can be triggered with a few clicks using the integrated DTA function (Direct Test Access). For ease of use, the generator also offers inputs supported by an integrated keyboard or thumbwheel with additional keys for sensitivity adjustment.
With the use of a secure digital (SD) memory card reader, firmware downloads are performed quickly and tests specified by the user are saved in full for future reference. A commercial SD memory card can be used for additional storage space and existing test files can be easily copied onto a larger SD card.
A wide range of test accessories is available for use with the NSG 3060 system.
Pricing for the NSG 3060 system start at $20,000. Lead-time is approximately 8-12 weeks ARO.
For more information, please contact MaryJane Salvador, Teseq Inc., 52 Mayfield Avenue, Edison, N.J. 08837. T: (732) 417-0501 x239;
F: (732) 417-0511; E: maryjane.salvador[.]teseq.com.
Teseq Inc. was formerly known as Schaffner Test Systems until a management buyout was finalized in November 2006. The company provides EMC instrumentation and test systems for radiated and conducted interference in the automotive, consumer electronics, telecommunications, medical, aerospace and defense industries. It has approximately 130 employees and has been accredited to perform calibration services according to ISO 17025 at its Edison, N.J. laboratory. Teseq is the only pulsed immunity manufacturer in North America with an accredited calibration lab.