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Strategic Test Releases Windows Vista Driver for Oscilloscope AWG and Fast Digital I/O Cards - Strategic Test Corporation has announced Windows Vista 64-bit and 32-bit drivers for their range of Digitizer, AWG, fast Digital I/O and Digital Pattern Generator cards
Strategic Test Releases Windows Vista Driver for Oscilloscope AWG and Fast Digital I/O Cards

 

NewswireToday - /newswire/ - Forest, Guernsey, United Kingdom, 2007/04/16 - Strategic Test Corporation has announced Windows Vista 64-bit and 32-bit drivers for their range of Digitizer, AWG, fast Digital I/O and Digital Pattern Generator cards.

   
 
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The drivers are compatible with all of the 150 PCI, PXI and CompactPCI cards in the UltraFast™ series.

The Windows Vista drivers are supplied at no cost and can be downloaded by existing customers from the company website. The same simple programming concept found in the other Windows and Linux drivers has been employed, allowing customers to upgrade their OS without modifying their application code.

There are two distinct advantages to 64-bit Windows over 32-bit. 64-bit Windows delivers higher computation performance, significantly benefiting users who perform real-time analysis of measurement data or signal processing. 64-bit Windows also supports up to 128 GBytes of PC RAM as compared to 4 GBytes of 32-bit Windows XP. This allows the use of low-cost PC-memory instead of expensive on-board memory for applications requiring streaming of data to or from the PC. This method also enables longer record or replay times, as the maximum amount of signal memory that can be added to the current range of Digitizer or AWG cards from most vendors is 4 GBytes.

For example, an application requiring a 200 MByte/second acquisition rate using 32-bit Windows, the maximum measurement time would be 17.5 seconds. On a PC configured with 128 GBytes RAM running 64-bit Windows the measurement time would increase to over 6.5 minutes.

About Strategic Test
With a product range of more than 150 high-speed Digitizer, Arbitrary Waveform Generator and high-speed Digital I/O PCI, 3U PXI and 6U CompactPCI cards, Strategic Test Corporation is one of the leading suppliers of high-speed PC-based instruments. The UltraFast cards are designed at the R&D facility in northern Germany and distributed through our offices in Woburn (MA) and Stockholm (Sweden).
The first high-speed measurement card for PC’s was designed in 1989. The UF2 series based on the PCI-X 66 MHz/32-bit PCI bus is the forth generation and sets new standards in onboard memory size, data transfer rates and user flexibility. Strategic Test’s clients include global electronics, semiconductor, defense, telecommunications and medical instrument companies, government funded research labs and universities in five continents.

Caption: Windows Vista drivers released for Oscilloscope, AWG and fast Digital I/O cards.

For further information please contact:
Bob Giblett, President
Strategic Test Corporation
12 Alfred Street, Suite 300
Woburn, MA 01801-1915
United States

T: 617-621-0080 / F: 617-621-1414
E: media[.]strategic-test.com.

 
 
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Strategic Test Releases Windows Vista Driver for Oscilloscope AWG and Fast Digital I/O Cards

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