PRTODAY / NewswireToday Free press release distribution service network

Written by / Agency / Source: National Instruments Corporation

Check Ads Availability|e-mail Article


Are you the owner of this article?, Turn it PREMIUM with your LOGO instead - and make it 3rd party Ads-Free! within the next hour!

National Instruments Expands SMU Family with Industry-Leading Channel Density - At Semicon West, National Instruments announced the expansion of its line of PXI SMUs for automated semiconductor test - NI.com
National Instruments Expands SMU Family with Industry-Leading Channel Density

 

NewswireToday - /newswire/ - Austin, TX, United States, 2012/07/10 - At Semicon West, National Instruments announced the expansion of its line of PXI SMUs for automated semiconductor test - NI.com. NASDAQ: NATI

   
 
Your Banner Ad Here instead - Showing along with ALL Articles covering Electronics/Instrumentation/RFID Announcements

Replace these Affiliate Programs at ANYTIME! Your banner here within the next hour. Learn How!


 

• The new NI PXIe-4143 source measure unit (SMU) features the highest channel density of any SMU on the market and one of the fastest sample rates, making it ideal for parallel testing of multipin semiconductor devices.
• The new SMU features NI SourceAdapt technology, which makes it possible for engineers to custom tune the SMU response for any device under test (DUT) load.
• NI engineers will demonstrate the new SMU at Semicon West in San Francisco, July 10–12, at North Hall booth #6360.

At Semicon West, National Instruments today announced the expansion of its line of PXI SMUs for automated semiconductor test. Ideal for parallel testing of multipin semiconductor DUTs, the new NI PXIe-4143 SMU offers 600,000 samples per second and four channels – the highest channel density of any SMU – and expands NI’s multichannel SMU output range to 24 V at 150 mA. Such features help reduce the cost of capital equipment, decrease test times and increase mixed-signal flexibility for a variety of DUTs.

“With the new NI PXIe-4143, our SMU family now gives test engineers DC measurement options for almost any device,” said Ron Wolfe, vice president of semiconductor test at National Instruments. “Our industry-leading channel counts, superior sample rates and SourceAdapt technology for custom tuning, provide one of the most flexible selections of semiconductor measurement instruments available.”

Product Features
• Four SMU channels with up to 600 kS/s sampling rate to measure fast transient responses;
• Four-quadrant output capability of 24 V at 150 mA, complementing preexisting NI SMU capabilities for sourcing and sinking;
• Measurement sensitivity of 10 pA;
• Flexible, compact PXI modular instrumentation architecture for small-footprint equipment deployments.

About National Instruments

Since 1976, National Instruments (ni.com) has equipped engineers and scientists with tools that accelerate productivity, innovation and discovery. NI’s graphical system design approach to engineering provides an integrated software and hardware platform that speeds the development of any system needing measurement and control. The company’s long-term vision and focus on improving society through its technology supports the success of its customers, employees, suppliers and shareholders.

 
 
Your Banner Ad Here instead - Showing along with ALL Articles covering Electronics/Instrumentation/RFID Announcements

Replace these Affiliate Programs at ANYTIME! Your banner here within the next hour. Learn How!


 

Written by / Agency / Source: National Instruments Corporation

 
 

Availability: All Regions (Including Int'l)

 

Traffic Booster: [/] Quick Newswire Today Visibility Checker

 

Distribution / Indexing: [+] / [Company listed above is a registered member of our network. Content made possible by PRZOOM / PRTODAY indexing services]

 
 
# # #
 
 
  Your Banner Ad showing on ALL
Electronics/Instrumentation/RFID articles,
CATCH Visitors via Your Competitors Announcements!


National Instruments Expands SMU Family with Industry-Leading Channel Density

Company website links NOT available to basic submissions
It is OK to republish and/or LINK any newswire for any legitimate media purpose as long as you name Newswire Today and LINK as the source.
 
  Is this your article?
Activate ALL web links and social stream by Upgrading to Press Release PREMIUM Plan Now!

National Instruments |
Publisher Contact: Trisha McDonell - NI.com 
512-683-8500 pr[.]ni.com
 
Newswire Today - PRZOOM / PRTODAY disclaims any content contained in this article. If you need/wish to contact the company who published the current release, you will need to contact them - NOT us. Issuers of articles are solely responsible for the accuracy of their content. Our complete disclaimer appears here.
IMPORTANT INFORMATION: Issuance, publication or distribution of this press release in certain jurisdictions could be subject to restrictions. The recipient of this press release is responsible for using this press release and the information herein in accordance with the applicable rules and regulations in the particular jurisdiction. This press release does not constitute an offer or an offering to acquire or subscribe for any National Instruments Corporation securities in any jurisdiction including any other companies listed or named in this release.

Electronics/Instrumentation/RFID via RSSAdd NewswireToday - PRZOOM Headline News to FeedBurner
Find who RetweetFollow @NewswireTODAY



Are you the owner of this article?, Turn it PREMIUM with your LOGO instead - and make it 3rd party Ads-Free! within the next hour!


Read Latest Articles From National Instruments Corporation / Company Profile


Read Electronics/Instrumentation/RFID Most Recent Related Newswires:

Frost & Sullivan Highlights Copper Mountain Technologies for its Robust USB VNA Solution
Mentor Announces First Annual FloTHERM Award for Electronics Thermal Design Excellence
SpacePole, Inc. Signs North American Distribution Agreement with BlueStar At the RetailNOW Trade Show
Mentor Announces Agenda, Keynotes and New Location for IESF Automotive 2017
Yokogawa Releases FieldMate® R3.03 Versatile Device Management Wizard
NI Announces New PXI Remote Control and Bus Extension Modules for High-Throughput Applications
Hungarian Ministry of Agriculture Selects Bruker NMR FoodScreener® for Authentication and Identification of Hungarian Wines
Bruker Introduces Software Package for Layer Analysis with XTrace Micro-XRF on Electron Microscopes
Global Unichip Achieves SGS-TUV ISO26262 Certification
NI Announces Industry’s First Remote Control Solution for PXI Systems with Thunderbolt™ 3
Bruker Announces Updated D2 PHASERTM Benchtop X-ray Diffraction (XRD) System with LYNXEYE XE-TTM One-dimensional Detector
Hitachi Joins Maker Faire Detroit with Sponsorship, Exhibit and Recruiting Drive
Curtiss-Wright Among First Aerospace COTS Vendors to Meet New AS9100 rev D Aerospace Supplier Standard
Mentor Supports Xilinx Zynq UltraScale+ MPSoC Platform with Updated Embedded Platform Release
NI Announces Multiple Antenna UE Support for its MIMO Application Framework to Further 5G Research

Boost Your Social Network
& Crowdfunding Campaigns


LIFETIME SOCIAL MEDIA WALL
NewswireToday Celebrates 10 Years in Business


PREMIUM Members


Visit  NAKIVO, Inc.

Visit  BizJobs.com





 
  ©2017 Newswire Today — Limelon Advertising, Co.
Home | About | Advertise/Pricing | Contact | Investors | Privacy/TOS | Sitemap | FRANCAIS
newswire, PR press releases distribution service magazines engine news alert newsroom press room breaking news public relations articles company news alerts newswiredistribution ezine bizentrepreneur biznewstoday digital business report market search pr firms agencies reports distri-bution today investor relation successful internet entrepreneurs newswire distribution prtoday.com freenewswiredistribution asianewstoday bizwiretoday USA pr UK today - NOT affiliated with PRNewswire as we declined their partnership offer in 2013
 
PRTODAY & NewswireTODAY are NOT affiliated with USA TODAY (usatoday.com)