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National Instruments Releases 2012 Automated Test Outlook - National Instruments released its 2012 Automated Test Outlook, which shares findings of the company’s research into the latest test and measurement technologies and methodologies - NI.com
National Instruments Releases 2012 Automated Test Outlook

 

NewswireToday - /newswire/ - Austin, TX, United States, 2012/02/13 - National Instruments released its 2012 Automated Test Outlook, which shares findings of the company’s research into the latest test and measurement technologies and methodologies - NI.com. NASDAQ: NATI

   
 
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· The report discusses the latest business strategies, architectures, computing, software and I/O influencing today’s and tomorrow’s electronics-based industries.
· With decades of experience in automated test, NI draws from its business relationships, internal expertise and third-party research to share some of the industry’s latest, most comprehensive insight.
· The report highlights how emerging mobile devices are shaping the industry and how organizations gain strategic advantages by making the most of their test organizations.

National Instruments today released its 2012 Automated Test Outlook, which shares findings of the company’s research into the latest test and measurement technologies and methodologies. The report details trends affecting numerous industries including consumer electronics, automotive, semiconductor, aerospace and defense, medical devices and communications. With insight from the report, engineers and managers can take advantage of the latest strategies and best practices for optimizing any test organization.

The 2012 report is organized into five categories: Business Strategy, Architectures, Computing, Software and I/O. It discusses the following major trends:

• Optimizing Test Organizations: Organizations are elevating test engineering to a strategic asset to gain a competitive edge over the competition.
• Measurements and Simulation in the Design Flow: Combining sophisticated models with real-world measurements improves product quality and reduces development time.
• PCI Express External Interfaces: The high-speed, low-latency bus internal to the PC is empowering new system topologies with external interface enhancements.
• Proliferation of Mobile Devices: The fact of a “smartphone in every pocket and a tablet in every bag” is changing how test systems are being controlled and monitored.
• Portable Measurement Algorithms: New tools are making it possible for measurement IP to be developed once and then deployed to a wide array of disparate processing elements.

The 2012 Automated Test Outlook is based on input from academic and industry research, user forums and surveys, business intelligence and customer advisory board reviews. With this data as its foundation, the report delivers a broad representation of the next generation of trends for meeting the business and technical challenges in test and measurement.

The Automated Test Outlook is part of the NI Test Leadership Council, which National Instruments created to share the best practices collected from working with thousands of global customers across multiple industries. The NI Test Leadership Council facilitates peer discussions among the leaders in test to provide both business and technical insight. Test Leadership Council activities include leadership summits, facilitated peer networking and technology exchanges.

To view the 2012 Automated Test Outlook, readers can visit ni.com/ato.

About National Instruments
Since 1976, National Instruments (ni.com) has equipped engineers and scientists with tools that accelerate productivity, innovation and discovery. NI’s graphical system design approach to engineering provides an integrated software and hardware platform that speeds the development of any system needing measurement and control. The company’s long-term vision and focus on improving society through its technology supports the success of its customers, employees, suppliers and shareholders.

 
 
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National Instruments Releases 2012 Automated Test Outlook

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National Instruments Corp |
Publisher Contact: Trisha McDonell - NI.com 
512-683-8500 pr[.]ni.com
 
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